Shin, Hyun Wook <br/><br/>
A conducting atomic force microscopy study of conducting filament nanobits in the epitaxial NiO thin film prepared precisely controlled by the oxidation time of the single crystalline Ni substrates.  [electronic resource] 

 -  Ultramicroscopy  Oct 2019 
 - 57-61 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>1879-2723 
<br/><br/><label>Standard No.: </label>10.1016/j.ultramic.2019.05.009  doi