TY  - GEN
AU  - Maraghechi,S
AU  - Hoefnagels,J P M
AU  - Peerlings,R H J
AU  - Rokoš,O
AU  - Geers,M G D
TI  - Correction of Scanning Electron Microscope Imaging Artifacts in a Novel Digital Image Correlation Framework
SN  - 0014-4851
PY  - 2019///
PB  - Experimental mechanics
N1  - Publication Type: Journal Article
UR  - https://doi.org/10.1007/s11340-018-00469-w
ER  -