Schune, Claire <br/><br/>
Combining Ellipsometry and AFM To Probe Subnanometric Precursor Film Dynamics of Polystyrene Melts.  [electronic resource] 

 -  Langmuir : the ACS journal of surfaces and colloids  Jun 2019 
 - 7727-7734 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>1520-5827 
<br/><br/><label>Standard No.: </label>10.1021/acs.langmuir.9b00768  doi