Lee, Wang Sik <br/><br/>
Detection of Ampicillin-Resistant   [electronic resource] 

 -  Nanomaterials (Basel, Switzerland)  May 2019 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>2079-4991 
<br/><br/><label>Standard No.: </label>10.3390/nano9050750  doi