TY  - GEN
AU  - Hong,Sae-Young
AU  - Kim,Hee-Joong
AU  - Kim,Dae-Hwan
AU  - Jeong,Ha-Yun
AU  - Song,Sang-Hun
AU  - Cho,In-Tak
AU  - Noh,Jiyong
AU  - Yun,Pil Sang
AU  - Lee,Seok-Woo
AU  - Park,Kwon-Shik
AU  - Yoon,SooYoung
AU  - Kang,In Byeong
AU  - Kwon,Hyuck-In
TI  - Study on the Lateral Carrier Diffusion and Source-Drain Series Resistance in Self-Aligned Top-Gate Coplanar InGaZnO Thin-Film Transistors
SN  - 2045-2322
PY  - 2019///
PB  - Scientific reports
N1  - Publication Type: Journal Article
UR  - https://doi.org/10.1038/s41598-019-43186-7
ER  -