Kim, Young Woong <br/><br/>
Performance of Extreme Ultraviolet Coherent Scattering Microscope.  [electronic resource] 

 -  Journal of nanoscience and nanotechnology  Oct 2019 
 - 6463-6467 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>1533-4880 
<br/><br/><label>Standard No.: </label>10.1166/jnn.2019.17072  doi