TY  - GEN
AU  - Song,Hyeong-Sub
AU  - Kim,So-Yeong
AU  - Lim,Dong-Hwan
AU  - Kwon,Sung-Kyu
AU  - Choi,Chang-Hwan
AU  - Lee,Ga-Won
AU  - Lee,Hi-Deok
TI  - Investigation of Positive Bias Temperature Instability Characteristics of Fully Depleted Silicon on Insulator Tunneling Field Effect Transistor with High-k Dielectric Gate Stacks
SN  - 1533-4880
PY  - 2019///
PB  - Journal of nanoscience and nanotechnology
N1  - Publication Type: Journal Article
UR  - https://doi.org/10.1166/jnn.2019.16992
ER  -