Song, Hyeong-Sub <br/><br/>
Investigation of Positive Bias Temperature Instability Characteristics of Fully Depleted Silicon on Insulator Tunneling Field Effect Transistor with High-k Dielectric Gate Stacks.  [electronic resource] 

 -  Journal of nanoscience and nanotechnology  Oct 2019 
 - 6131-6134 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>1533-4880 
<br/><br/><label>Standard No.: </label>10.1166/jnn.2019.16992  doi