TY  - GEN
AU  - Hu,Changkui
AU  - Chen,Qiong
AU  - Chen,Fengxiang
AU  - Gfroerer,T H
AU  - Wanlass,M W
AU  - Zhang,Yong
TI  - Overcoming diffusion-related limitations in semiconductor defect imaging with phonon-plasmon-coupled mode Raman scattering
SN  - 2047-7538
PY  - 2018///
PB  - Light, science & applications
N1  - Publication Type: Journal Article
UR  - https://doi.org/10.1038/s41377-018-0016-y
ER  -