Hu, Changkui <br/><br/>
Overcoming diffusion-related limitations in semiconductor defect imaging with phonon-plasmon-coupled mode Raman scattering.  [electronic resource] 

 -  Light, science & applications  2018 
 - 23 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>2047-7538 
<br/><br/><label>Standard No.: </label>10.1038/s41377-018-0016-y  doi