TY  - GEN
AU  - Park,Woojin
AU  - Kim,Tae Hyeon
AU  - Nam,Jae Hyeon
AU  - Jang,Hye Yeon
AU  - Pak,Yusin
AU  - Min,Jung-Wook
AU  - Yun,Joho
AU  - Cho,Byungjin
TI  - Facile fabrication of ZnO nanowire memory device based on chemically-treated surface defects
SN  - 1361-6528
PY  - 2019///0212
N1  - Publication Type: Journal Article
UR  - https://doi.org/10.1088/1361-6528/aaff74
ER  -