Tian, Yanling <br/><br/>
A novel method and system for calibrating the spring constant of atomic force microscope cantilever based on electromagnetic actuation.  [electronic resource] 

 -  The Review of scientific instruments  Dec 2018 
 - 125119 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>1089-7623 
<br/><br/><label>Standard No.: </label>10.1063/1.5051401  doi