Lee, Lan-Hsuan <br/><br/>
Plan-view transmission electron microscopy specimen preparation for atomic layer materials using a focused ion beam approach.  [electronic resource] 

 -  Ultramicroscopy  02 2019 
 - 95-99 p.  digital 
<br/><br/> Publication Type: Journal Article; Research Support, Non-U.S. Gov't 
<br/><br/><label>ISSN: </label>1879-2723 
<br/><br/><label>Standard No.: </label>10.1016/j.ultramic.2018.12.001  doi