TY  - GEN
AU  - Park,Ye-Jin
AU  - Kwak,Hyeon-Tak
AU  - Chang,Seung-Bo
AU  - Kim,Hyun-Seok
TI  - Breakdown Voltage Enhancement in AlGaN/GaN High-Electron Mobility Transistor by Optimizing Gate Field-Plate Structure
SN  - 1533-4880
PY  - 2019///
PB  - Journal of nanoscience and nanotechnology
N1  - Publication Type: Journal Article
UR  - https://doi.org/10.1166/jnn.2019.15991
ER  -