TY  - GEN
AU  - Wu,Chien-Hung
AU  - Chang,Kow-Ming
AU  - Chen,Yi-Ming
AU  - Zhang,Yu-Xin
AU  - Cheng,Chia-Yao
TI  - The Effect of Microwave Annealing of Reliability Characteristics on Amorphous IGZO Thin Film Transistors
SN  - 1533-4880
PY  - 2019///
PB  - Journal of nanoscience and nanotechnology
N1  - Publication Type: Journal Article
UR  - https://doi.org/10.1166/jnn.2019.15996
ER  -