Wu, Chien-Hung <br/><br/>
The Effect of Microwave Annealing of Reliability Characteristics on Amorphous IGZO Thin Film Transistors.  [electronic resource] 

 -  Journal of nanoscience and nanotechnology  Apr 2019 
 - 2189-2192 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>1533-4880 
<br/><br/><label>Standard No.: </label>10.1166/jnn.2019.15996  doi