S Veum, Kristen <br/><br/>
Predicting Profile Soil Properties with Reflectance Spectra via Bayesian Covariate-Assisted External Parameter Orthogonalization.  [electronic resource] 

 -  Sensors (Basel, Switzerland)  Nov 2018 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>1424-8220 
<br/><br/><label>Standard No.: </label>10.3390/s18113869  doi