Lutz-Bueno, V <br/><br/>
Model-free classification of X-ray scattering signals applied to image segmentation.  [electronic resource] 

 -  Journal of applied crystallography  Oct 2018 
 - 1378-1386 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>0021-8898 
<br/><br/><label>Standard No.: </label>10.1107/S1600576718011032  doi