Srinivasan, Avinash <br/><br/>
Secondary Electron Energy Contrast of Localized Buried Charge in Metal-Insulator-Silicon Structures.  [electronic resource] 

 -  Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada  10 2018 
 - 453-460 p.  digital 
<br/><br/> Publication Type: Journal Article; Research Support, Non-U.S. Gov't 
<br/><br/><label>ISSN: </label>1435-8115 
<br/><br/><label>Standard No.: </label>10.1017/S1431927618015052  doi