Hamano, Akihide <br/><br/>
Semiconductor property imaging on as-grown wafer with monochromatic tunable THz-wave source.  [electronic resource] 

 -  The Review of scientific instruments  Jul 2018 
 - 073701 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>1089-7623 
<br/><br/><label>Standard No.: </label>10.1063/1.5025228  doi