TY  - GEN
AU  - Kao,Yun-Feng
AU  - Zhuang,Wei Cheng
AU  - Lin,Chrong-Jung
AU  - King,Ya-Chin
TI  - A Study of the Variability in Contact Resistive Random Access Memory by Stochastic Vacancy Model
SN  - 1931-7573
PY  - 2018///
PB  - Nanoscale research letters
N1  - Publication Type: Journal Article
UR  - https://doi.org/10.1186/s11671-018-2619-x
ER  -