Helfenstein, Patrick <br/><br/>
Beam drift and partial probe coherence effects in EUV reflective-mode coherent diffractive imaging.  [electronic resource] 

 -  Optics express  Apr 2018 
 - 12242-12256 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>1094-4087