TY  - GEN
AU  - Kwon,Joon-Sung
AU  - Beak,Ji-Young
AU  - Kang,Nam-Woo
AU  - Hong,Minki
AU  - Lim,Changjin
AU  - Im,JaeHyuk
AU  - Oh,Semi
AU  - Jeong,Bong-Yong
AU  - Cho,Soohaeng
AU  - Kim,Kyoung-Kook
TI  - High Reliability of Ag Reflectors with AgCu Alloy for High Efficiency GaN-Based Light Emitting Diodes
SN  - 1533-4880
PY  - 0000///092018///
PB  - Journal of nanoscience and nanotechnology
N1  - Publication Type: Journal Article
UR  - https://doi.org/10.1166/jnn.2018.15581
ER  -