Surmick, David M <br/><br/>
Uncertainty of Integrated Intensity Following Line Profile Fitting of Multiline Spectra.  [electronic resource] 

 -  Applied spectroscopy  May 2018 
 - 787-792 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>1943-3530 
<br/><br/><label>Standard No.: </label>10.1177/0003702818756652  doi