Pham, Tuan Anh <br/><br/>
Integrating Ab Initio Simulations and X-ray Photoelectron Spectroscopy: Toward A Realistic Description of Oxidized Solid/Liquid Interfaces.  [electronic resource] 

 -  The journal of physical chemistry letters  Jan 2018 
 - 194-203 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>1948-7185 
<br/><br/><label>Standard No.: </label>10.1021/acs.jpclett.7b01382  doi