Zhang, Yinyu <br/><br/>
Single-shot, real-time carrier-envelope phase measurement and tagging based on stereographic above-threshold ionization at short-wave infrared wavelengths.  [electronic resource] 

 -  Optics letters  Dec 2017 
 - 5150-5153 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>1539-4794 
<br/><br/><label>Standard No.: </label>10.1364/OL.42.005150  doi