TY  - GEN
AU  - Avci,Oguzhan
AU  - Yurdakul,Celalettin
AU  - Selim Ünlü,M
TI  - Nanoparticle classification in wide-field interferometric microscopy by supervised learning from model
SN  - 1539-4522
PY  - 2018///0205
N1  - Publication Type: Journal Article
UR  - https://doi.org/10.1364/AO.56.004238
ER  -