Avci, Oguzhan <br/><br/>
Nanoparticle classification in wide-field interferometric microscopy by supervised learning from model.  [electronic resource] 

 -  Applied optics  May 2017 
 - 4238-4242 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>1539-4522 
<br/><br/><label>Standard No.: </label>10.1364/AO.56.004238  doi