TY  - GEN
AU  - Karge,Lukas
AU  - Gilles,Ralph
AU  - Busch,Sebastian
TI  - Calibrating SANS data for instrument geometry and pixel sensitivity effects: access to an extended 
SN  - 0021-8898
PY  - 2017///
PB  - Journal of applied crystallography
N1  - Publication Type: Journal Article
UR  - https://doi.org/10.1107/S1600576717011463
ER  -