Karge, Lukas <br/><br/>
Calibrating SANS data for instrument geometry and pixel sensitivity effects: access to an extended   [electronic resource] 

 -  Journal of applied crystallography  Oct 2017 
 - 1382-1394 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>0021-8898 
<br/><br/><label>Standard No.: </label>10.1107/S1600576717011463  doi