Norris, D J <br/><br/>
Comparison of cross-sectional transmission electron microscope studies of thin germanium epilayers grown on differently oriented silicon wafers.  [electronic resource] 

 -  Journal of microscopy  12 2017 
 - 288-297 p.  digital 
<br/><br/> Publication Type: Journal Article; Research Support, Non-U.S. Gov't 
<br/><br/><label>ISSN: </label>1365-2818 
<br/><br/><label>Standard No.: </label>10.1111/jmi.12654  doi