Vieira, E M F <br/><br/>
SiGe layer thickness effect on the structural and optical properties of well-organized SiGe/SiO  [electronic resource] 

 -  Nanotechnology  Aug 2017 
 - 345701 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>1361-6528 
<br/><br/><label>Standard No.: </label>10.1088/1361-6528/aa7a50  doi