TY  - GEN
AU  - Wang,Xing
AU  - Liu,Hongxia
AU  - Zhao,Lu
AU  - Fei,Chenxi
AU  - Feng,Xingyao
AU  - Chen,Shupeng
AU  - Wang,Yongte
TI  - Structural Properties Characterized by the Film Thickness and Annealing Temperature for La
SN  - 1931-7573
PY  - 2017///
PB  - Nanoscale research letters
N1  - Publication Type: Journal Article
UR  - https://doi.org/10.1186/s11671-017-2018-8
ER  -