Hettler, Simon <br/><br/>
Carbon contamination in scanning transmission electron microscopy and its impact on phase-plate applications.  [electronic resource] 

 -  Micron (Oxford, England : 1993)  May 2017 
 - 38-47 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>1878-4291 
<br/><br/><label>Standard No.: </label>10.1016/j.micron.2017.02.002  doi