Geist, Jon <br/><br/>
Numerical Modeling of Silicon Photodiodes for High-Accuracy Applications Part III: Interpolating and Extrapolating Internal Quantum-Efficiency Calibrations.  [electronic resource] 

 -  Journal of research of the National Institute of Standards and Technology   
 - 481-492 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>1044-677X 
<br/><br/><label>Standard No.: </label>10.6028/jres.096.025  doi