Crippa, Alessandro <br/><br/>
Level Spectrum and Charge Relaxation in a Silicon Double Quantum Dot Probed by Dual-Gate Reflectometry.  [electronic resource] 

 -  Nano letters  02 2017 
 - 1001-1006 p.  digital 
<br/><br/> Publication Type: Letter; Research Support, Non-U.S. Gov't 
<br/><br/><label>ISSN: </label>1530-6992 
<br/><br/><label>Standard No.: </label>10.1021/acs.nanolett.6b04354  doi