Yang, Jeong-Suong <br/><br/>
Comparison of the Thermal Degradation of Heavily Nb-Doped and Normal PZT Thin Films.  [electronic resource] 

 -  IEEE transactions on ultrasonics, ferroelectrics, and frequency control  03 2017 
 - 617-622 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>1525-8955 
<br/><br/><label>Standard No.: </label>10.1109/TUFFC.2017.2647971  doi