TY  - GEN
AU  - Postek,Michael T
AU  - Vladar,Andras E
AU  - Jones,Samuel N
AU  - Keery,William J
TI  - Interlaboratory Study on the Lithographically Produced Scanning Electron Microscope Magnification Standard Prototype
SN  - 1044-677X
PY  - 0000///
PB  - Journal of research of the National Institute of Standards and Technology
N1  - Publication Type: Journal Article
UR  - https://doi.org/10.6028/jres.098.033
ER  -