TY  - GEN
AU  - Hernández-Rivera,Efraín
AU  - Coleman,Shawn P
AU  - Tschopp,Mark A
TI  - Using Similarity Metrics to Quantify Differences in High-Throughput Data Sets: Application to X-ray Diffraction Patterns
SN  - 2156-8944
PY  - 2017///0808
KW  - Cluster Analysis
KW  - High-Throughput Screening Assays
KW  - methods
KW  - Normal Distribution
KW  - Powder Diffraction
KW  - X-Ray Diffraction
N1  - Publication Type: Journal Article; Research Support, U.S. Gov't, Non-P.H.S
UR  - https://doi.org/10.1021/acscombsci.6b00142
ER  -