Hernández-Rivera, Efraín <br/><br/>
Using Similarity Metrics to Quantify Differences in High-Throughput Data Sets: Application to X-ray Diffraction Patterns.  [electronic resource] 

 -  ACS combinatorial science  01 2017 
 - 25-36 p.  digital 
<br/><br/> Publication Type: Journal Article; Research Support, U.S. Gov't, Non-P.H.S. 
<br/><br/><label>ISSN: </label>2156-8944 
<br/><br/><label>Standard No.: </label>10.1021/acscombsci.6b00142  doi 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Cluster Analysis<br/>High-Throughput Screening Assays--methods<br/>Normal Distribution<br/>Powder Diffraction--methods<br/>X-Ray Diffraction--methods