TY  - GEN
AU  - Wagner,R
AU  - Woehl,T J
AU  - Keller,R R
AU  - Killgore,J P
TI  - Detection of atomic force microscopy cantilever displacement with a transmitted electron beam
SN  - 0003-6951
PY  - 0000///072016///
PB  - Applied physics letters
N1  - Publication Type: Journal Article
UR  - https://doi.org/10.1063/1.4960192
ER  -