TY  - GEN
AU  - Obeng,Yaw S
AU  - Okoro,Chukwudi A
AU  - Amoah,Papa K
AU  - Dai,Johnny
AU  - Vartanian,Victor H
TI  - Towards Understanding Early Failures Behavior during Device Burn-In: Broadband RF Monitoring of Atomistic Changes in Materials
SN  - 2162-8769
PY  - 2016///
PB  - ECS journal of solid state science and technology : JSS
N1  - Publication Type: Journal Article
UR  - https://doi.org/10.1149/2.0411609jss
ER  -