Obeng, Yaw S <br/><br/>
Towards Understanding Early Failures Behavior during Device Burn-In: Broadband RF Monitoring of Atomistic Changes in Materials.  [electronic resource] 

 -  ECS journal of solid state science and technology : JSS  2016 
 - N61-N66 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>2162-8769 
<br/><br/><label>Standard No.: </label>10.1149/2.0411609jss  doi