TY  - GEN
AU  - Vargas,J
AU  - Franken,E
AU  - Sorzano,C O S
AU  - Gomez-Blanco,J
AU  - Schoenmakers,R
AU  - Koster,A J
AU  - Carazo,J M
TI  - Foil-hole and data image quality assessment in 3DEM: Towards high-throughput image acquisition in the electron microscope
SN  - 1095-8657
PY  - 2017///1220
KW  - Cryoelectron Microscopy
KW  - methods
KW  - Data Collection
KW  - High-Throughput Screening Assays
KW  - Image Processing, Computer-Assisted
KW  - Imaging, Three-Dimensional
KW  - Microscopy, Electron, Transmission
N1  - Publication Type: Journal Article; Research Support, Non-U.S. Gov't
UR  - https://doi.org/10.1016/j.jsb.2016.10.006
ER  -