Qian, Kai <br/><br/>
Direct Observation of Conducting Filaments in Tungsten Oxide Based Transparent Resistive Switching Memory.  [electronic resource] 

 -  ACS applied materials & interfaces  Oct 2016 
 - 27885-27891 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>1944-8252 
<br/><br/><label>Standard No.: </label>10.1021/acsami.6b08154  doi