Chawla, Vipin <br/><br/>
Interfacial coherency stress distribution in TiN/AlN bilayer and multilayer films studied by FEM analysis.  [electronic resource] 

 -  Computational materials science  Apr 2012 
 - 211-216 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>0927-0256 
<br/><br/><label>Standard No.: </label>10.1016/j.commatsci.2011.11.024  doi