TY  - GEN
AU  - Schäfer,Norbert
AU  - Wilkinson,Angus J
AU  - Schmid,Thomas
AU  - Winkelmann,Aimo
AU  - Chahine,Gilbert A
AU  - Schülli,Tobias U
AU  - Rissom,Thorsten
AU  - Marquardt,Julien
AU  - Schorr,Susan
AU  - Abou-Ras,Daniel
TI  - Microstrain distribution mapping on CuInSe2 thin films by means of electron backscatter diffraction, X-ray diffraction, and Raman microspectroscopy
SN  - 1879-2723
PY  - 2018///0126
N1  - Publication Type: Journal Article; Research Support, Non-U.S. Gov't
UR  - https://doi.org/10.1016/j.ultramic.2016.07.001
ER  -