Schäfer, Norbert <br/><br/>
Microstrain distribution mapping on CuInSe2 thin films by means of electron backscatter diffraction, X-ray diffraction, and Raman microspectroscopy.  [electronic resource] 

 -  Ultramicroscopy  10 2016 
 - 89-97 p.  digital 
<br/><br/> Publication Type: Journal Article; Research Support, Non-U.S. Gov't 
<br/><br/><label>ISSN: </label>1879-2723 
<br/><br/><label>Standard No.: </label>10.1016/j.ultramic.2016.07.001  doi