TY  - GEN
AU  - Jang,Sung Hwan
AU  - Ryu,Ju Tae
AU  - Jung,Hyun Soo
AU  - Kim,Tae Whan
TI  - Improvement of Resistive Random Access Memory Device Performance via Embedding of Low-K Dielectric Layer
SN  - 1533-4899
PY  - 2016///0808
N1  - Publication Type: Journal Article; Research Support, Non-U.S. Gov't
UR  - https://doi.org/10.1166/jnn.2016.11951
ER  -