Carta, D <br/><br/>
X-ray spectromicroscopy investigation of soft and hard breakdown in RRAM devices.  [electronic resource] 

 -  Nanotechnology  Aug 2016 
 - 345705 p.  digital 
<br/><br/> Publication Type: Journal Article 
<br/><br/><label>ISSN: </label>1361-6528 
<br/><br/><label>Standard No.: </label>10.1088/0957-4484/27/34/345705  doi